PHOTON RT 7514 LWIR Spectrophotometers
Spectrophotometers For Optical Coatings
PHOTON RT 7514 LWIR Spectrophotometer
The PHOTON RT 7514 spectrophotometer is a unique dispersive-type instrument designed for LWIR (7,500 nm – 14,000 nm) transmission and reflection measurements of optical coatings. It operates at both normal and variable angles of incidence, supporting S- and P-polarization.
Description
Application
Long-wave Infrared Transmittance and Refectance Measurements of Plano Optics at Normal and Variable Angles of Incidence
Description
Accurate and reliable infrared spectral measurements of optical coatings present one of the most critical challenges today. Optical manufacturers worldwide are specifying increasingly sophisticated IR coatings for their planar optics, aiming for improved long-distance object detection and identification. Often, production capabilities for obtaining these optical coatings outpace existing metrological capabilities for certifying their quality.
The PHOTON RT 7514 spectrophotometer is a purpose-built instrument specifically designed to effectively address these challenges. It measures the transmission and reflection of coatings for the LWIR spectral range. An unsurpassed feature of the PHOTON RT 7514 is its ability to perform automatic measurements at variable angles of incidence (up to 60 degrees) with polarized light. To support these demanding tests, a built-in feature accurately compensates for beam displacement at high angles, ensuring S- and P-polarization measurements are delivered in just a few minutes. A record maximum sample thickness of 40 mm is supported.
KEY ADVANTAGES:
- Dispersive Spectrophotometer
- High-accuracy measurements at normal and variable Angles of Incidence (AOI)
- Built-in high-contrast polarizer
- Extremely low noise measurements
- Fully automatic operation
- Optimized Signal-to-Noise Ratio
Specifications
| PARAMETER | DESCRIPTION |
|---|---|
| MODEL | 7514 |
| OPTICAL CONFIGURATION | |
| Photometric functions | %T, %R |
| Effective wavelength range, µm | 7,5 – 14,0 |
| Built-in polarizers, µm | 7,5 – 14,0 |
| Optical scheme of monochromator | Czerny-Turner |
| Optics | Mirror: Au, Lenses: ZnSe + AR |
| Measurement of Transmission | Variable angle measurements: 0 – 60 deg angles of incidence |
| Measurement of Reflection | Interchangeable sample stages with fixed angles of incidence: 10, 30, 45 and 60 deg
Reference sample: gold mirror |
| Turning pitch angle of sample stage, deg | 0,01 |
| Beam displacement compensation, mm | 40 |
| Unattended polarization measurements with buil-in polarizers | S, P, (S + P) / 2 |
| Wavelength sampling pitch, nm | 5 – 100 |
| Spot size on measured sample (non-polarized light), mm | 2,0 x 6,0 (W x H) |
| Ultimate spectral resolution (non-polarized light), nm | 15 |
| Wavelength accuracy, nm | + / – 4,0 |
| Wavelength repeat accuracy, nm | + / – 2,0 |
| Photometric accuracy (47% T, λ0 = 10,6 µm, AOI = 40) | + / – 0,2% |
| Photometric repeat accuracy | + / – 0,1% |
| Stability of baseline (7,8 µm – 13,0 µm), % / hour* | + / – 0,3% |
| Stray light level ( (7,5 µm – 12,0 µm), % | < 0,2 |
| Light sources | IR lamp
HgAr wavelenth calibration verification lamp |
| SAMPLE COMPARTMENT | |
| Maximum sample size, mm | 150 x 200 |
| Maximum sample thickness, mm | 40 |
| Planar sample stage | For measurement of transmission and reflection of planar samples with size bigger than 8.0mm x 12mm |
| Synchronized positioning | Synchronized computer controlled positioning for sample stage and photodetectors unit (transmission) |
| INTERFACE, DIMENSIONS AND WEIGHT | |
| Interface | USB 2.0 |
| Power consumption, Watt | 110 |
| Power input | 110 – 220 VAC, 50 – 60 Hz |
| Width x Depth x Height, mm | 760 x 380 x 350 (30″ x 15.0″ x 13 3/5″) |
| Net weight, kg (lbs) | 51 (112) |
| * 60 minutes warm-up time
The information provided represents typical product specifications and is subject to change without prior notice. Actual specifications may vary for individual units. |
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