PHOTON RT UV-VIS-MWIR Spectrophotometer
Spectrophotometers For Optical Coatings
PHOTON RT UV-VIS-MWIR Spectrophotometer
The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is a versatile instrument designed for unattended measurements of planar optical parts with coatings in the 185-5200 nm wavelength range. It measures absolute reflectance and transmittance at angles of incidence from 0 to 75 degrees and with variable polarization, all without needing any additional attachments.
Description
Designed for precision. Built for performance.
PHOTON RT is the world’s first spectrophotometer built specifically for optical coaters. It is also the only instrument capable of polarization measurements across an unprecedented UV–MWIR range (220–5200 nm), delivering unique insights into the real-world performance of optical coatings.
Designed for fully automated spectral analysis of coated optics, PHOTON RT supports absolute reflectance and transmittance measurements and is available in three configurations, covering wavelengths from 185 nm to 5200 nm.
KEY ADVANTAGES:
- Broad Wavelength Coverage – Configurable for measurements from 185 nm to 5200 nm in a single instrument. Enables absolute transmittance and reflectance measurements, including angular and polarization-dependent analysis, without the need for costly fixtures or accessories.
- Seamless Spectrum Stitching – Virtually no spectral discontinuities at grating and detector changeover points, eliminating a common source of measurement artifacts and ensuring uninterrupted spectral data.
- Substantially Faster Measurements – Significantly outperforms conventional chemistry-type spectrophotometers, especially in batch measurements involving multiple angles of incidence and polarization states.
- Baseline Stability – No need for recalibration when adjusting the angle of incidence or switching between transmittance and reflectance modes.
- Comprehensive Thin-Film Analysis – Transmittance and absolute specular reflectance are measured from the same sample area, ensuring accurate reverse engineering.
- Versatile Prism Measurement – Supportds characterization of single-element and cemented beamsplitters and prisms, whether mounted or unmounted.
- Minimized Human Error – Automated procedures ensure consistent, reproducible result
- Optimized for Laboratory Use – Silent, precise lid mechanism ensures stable operation.
The PHOTON RT spectrophotometer sets a new standard in coating metrology, delivering unmatched accuracy, efficiency, and reliability to meet the most demanding optical coating requirements.
Specifications
PHOTON RT Multifunctional Spectrophotometer. Technical Specifications
| PHOTON RT Spectrophotometer. Product Configuration |
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|---|---|---|---|---|---|---|
| MODEL | 0217 | 0226 | 0252 | |||
| OPTICAL CONFIGURATION | ||||||
| Photometric functions | %T, %R | |||||
| Effective wavelength range, nm | 185 – 1700 | 185 – 2600 | 185 – 5200 | |||
| Built-in polarizer, nm | 220 – 1700 | 220 – 2600 | 220 – 5200 | |||
| Optical scheme of monochromator | Czerny-Turner | |||||
| Optics | Mirror, MgF2 | |||||
| Reference channel | Yes | |||||
| Wavelength sampling pitch, nm | 0,1 – 100 | |||||
| Spot size on the measured sample, mm | 6 x 2 → 2 x 2 | |||||
| Turning pitch angle of sample stage | 0,01 deg | |||||
| Turning pitch angle of photodetectors | 0,01 deg | |||||
| Beam displacement compensation | -60,0 mm … 0 … +60,0 mm (actual value depends on detector position) |
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| Variable angle measurements | 1. 0 – 75 deg for transmittance (up to 85 deg with 7085 sample stage) 2. 8 – 75 deg for absolute reflectance (up to 85 deg with 7085 sample stage) 3. Detector rotation range: 300 deg … 180 deg … 16 deg 4. Sample stage rotation range: -85 deg … 0 deg … +85 deg |
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| Wavelength subranges, nm | Ultimate spectral resolution, nm (non-polarized light) | Wavelength accuracy, nm | Wavelength repeat accuracy, nm | |||
| 185 – 990 nm | 0,6 | +/- 0,5 | +/- 0,25 | |||
| 990 – 1700 / 2450 / 2600 nm | 1,2 | +/- 1,0 | +/- 0,5 | |||
| 2450 – 5200 nm | 3,0 | +/- 2,0 | +/- 1,0 | |||
| Stray light level, % at 532 nm | ˂ 0,1 | |||||
| Angle of beam divergence | +/-1 deg | |||||
| Photometric accuracy | (VIS)
+/-0,0045 Abs (1 Abs); +/-0,0025 Abs (0,33 Abs); +/-0,0058 Abs (1.5 Abs) (MWIR) NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
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| Photometric repeat accuracy (VIS range) | (VIS)
0,0004 Abs (1 Abs); 0,0001 Abs (0,33 Abs); 0,005 Abs (1.5 Abs) (MWIR) NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
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| Stability of baseline, %/hour (VIS range) | ˂ 0,1 (one hour warm-up time) | |||||
| Unattended polarization measurements with built-in polarizers | S, P, (S + P) / 2 | |||||
| Zero order / Green beam | Built-in, automatic | |||||
| Light sources, preinstalled | 1. Deuterium lamp: 1 ea 2. Halogen lamp: 1 ea 3. IR source: 1 ea (model 0252) 4. HgAr wavelength calibration lamp: 1 ea |
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| Light sources, spare | Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered additionally |
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| SAMPLE COMPARTMENT | ||||||
| Dovetail baseplate for sample stages | Designed for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage | |||||
| Planar sample stage | For measurement of transmission and reflection of planar samples with size bigger than 12,0 x 10,0 mm | |||||
| Independent positioning | Independent computer controlled positioning of sample stage and photodetectors unit | |||||
| Synchronized positioning | Synchronized computer controlled positioning of sample stage and photodetectors unit depending on the selected photometric function | |||||
| Size of samples | Min. 12,0 x 10,0 mm – for measurement at 0 – 10 deg incidence angles
Min. 12,0 x 25,0 mm – for measurement at 10 – 75 deg incidence angles Max. sample size:
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| Sample stage for PBS cubes | 50,0 x 50,0 x 50,0 mm sample stage with two additional cube holders 1″ x 1″ x 1″ and 1/2″ x 1/2″ x 1/2″ | |||||
| Optional motorized and non-motorized sample stage | 1. MP Stage. Multiple sample measurement 2. XY Stage. XY sample mapping 3. XY-MZF Stage. Measurement of multi-zone filters and linear variable filters 4. Z Stage. Sequential baseline calibration and sample measurement without opening the lid 5. QW Stage. Testing of wave plates 6. R Stage. 360 deg rotation of the sample around the beam axis 7. 7085 Stage. Measurement at extreme angles of incidence up to 85 deg |
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| INTERFACE, DIMENSIONS AND WEIGHT | ||||||
| Interface | USB 2.0, Windows-based, English | |||||
| File saving formats | res (txt), xls, pdf, csv | |||||
| Power consumption, Watt | 110 | |||||
| Power input | 110 – 220 V (+/-10%), 50 – 60 Hz | |||||
| Width х Depth х Height, mm (inches) | 425 x 625 x 285 (16 3/4″ x 24 2/3″ x 10 1/5″) | |||||
| Net weight, kg (lbs) | 50 (110) | |||||
Values are measured after 60 minutes warm-up time
The information provided represents typical product specifications and is subject to change without prior notice. Actual specifications may vary for individual units.
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