PHOTON RT 0420 Ultra Spectrophotometer
Spectrophotometers For Optical Coatings
PHOTON RT 0420 Ultra Spectrophotometer
High-performance spectrophotometer for VIS-SWIR transmission measurement of ultra-narrow bandpass filters, edge filters with extremely steep slopes, notch filters, and coatings with high optical density.
Description
Laser Focus World 2024 Innovators Award: Gold Honoree
Category: Test and Measurment
Exceptional optical coatings demand exceptional metrology.
Unlock the power of precision with our latest PHOTON RT 0420 Ultra spectrophotometer.
Featuring an unprecedented 0.06 nm spectral resolution, the PHOTON RT 0420 Ultra delivers unmatched flexibility for performance qualification of cutting-edge filters. Its advanced capabilities enable broadband measurements down to OD8, with the ability to characterize slope steepness as small as 0.02%.
Designed to meet the rigorous demands of ultra coatings, the PHOTON RT 0420 Ultra features a wavelength range of 340nm to 2000nm and is tailored for a diverse range of coatings for advanced applications, including LIDARs, fluorescence microscopy, laser safety, telecom, space exploration, defense, and security.
Whether you are striving to produce exceptional optical coatings or planning to do so soon, look no further than our latest PHOTON RT 0420 Ultra spectrophotometer!
Specifications
| PARAMETER | DESCRIPTION |
|---|---|
| OPTICAL CONFIGURATION | |
| Optical scheme of monochromator | Double Additive Czerny-Turner |
| Optics | Mirror, protected Ag |
| Reference channel | Yes |
| Wavelength sampling pitch, nm | 0,01 to 100 |
| Spot size on the measured sample, mm | 4 x 3 |
| Photometric functions | %T, OD |
| Effective wavelength range, nm | 340 – 2000 |
| Ultimate spectral resolution, nm
400-990 nm 990-2000 nm |
0,06 0,13 |
| Wavelength accuracy, nm
400-990 nm 990-2000 nm |
+/- 0,02 +/- 0,04 |
| Wavelength repeat accuracy, nm
400-990 nm 990-2000 nm |
+/- 0,01 +/- 0,02 |
| Ultimate optical density, -log10(T)
340-420 nm 420-925 nm 925-2000 nm |
6 8 7 |
| Stray light level, % at 532 nm | < 0,000001 (1x10E-6) |
| Angle of beam divergence, deg | +/- 0,2 |
| Photometric accuracy | (VIS) NIST SRM 930e: +/-0.0045 Abs (1 Abs)NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.0058 Abs (1,5 Abs) |
| Photometric repeat accuracy | (VIS)
NIST SRM 930e: 0.0004 Abs (1 Abs) NIST SRM 1930: 0.0001 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
| Stability of baseline, %/hour | < 0,2 (one hour warm-up time) |
| Light sources | High energy plasma source, HgAr wavelength calibration lamp. All sources built-in and pre-configured |
| SAMPLE COMPARTMENT | |
| Standard sample stage (included) | Measurement of transmission of plano samples with size greater than 8 x 10 mm |
| Size of samples | Min. 6 x 4 mm
Max. sample size:
|
| INTERFACE, DIMENSIONS AND WEIGHT | |
| Interface | USB 2.0, Windows-based, English |
| File saving options | res (txt), xls, pdf, csv |
| Power consumption, Watt | 250 |
| Power input | 110-220 V, 50-60 Hz |
| Width x Depth x Height, mm (inches) | 820 х 545 х 360 (32 2/5″ х 25 2/5″ х 14 1/5″) |
| Net weight, kg (lbs) | 55 (121) |
| Values measured after 60 minutes warm-up time
The information provided represents typical product specifications and is subject to change without prior notice. Actual specifications may vary for individual units. |
|
Reviews
There are no reviews yet.